PE IR

High-resolution objectives lens that are for near infrared wavelengths up to 1600nm. This series of objective lens has a long working distance with high spectral transmission percentage.

Full specs are available for download on the datasheets.

PE IR

PE IR

Ideal for backside inspection of wafers and photo emission applications. LCD and Silicon thickness corrected versions available. Applications include:

  • Laser Marking 
  • Laser Cutting 
  • Photo emission detection
Model Magnification Working Distance N.A. RP (μm) DOF (μm) Eyepiece FOV (mm) 2/3” Format FOV (mm)
PEIR-Plan-HR-20x
20x
10.0
0.60
1.5
2.1
1.1
0.44 x 0.33
PEIR-Plan-HR-50x
50x
10.0
0.71
1.2
1.2
0.44
0.17 x 0.13
PEIR-Plan-1x
1x
12.0
0.03
18.4
611.0
0.22
8.8 x 6.6
PEIR-Plan-2-5x
2.5x
28.0
0.10
0.3
55.0
8.8
3.5 x 2.6
PEIR-Plan-20x
20x
12.0
0.50
1.1
2.2
1.1
0.44 x 0.33
PEIR-Plan-50x
50x
10.0
0.60
0.9
1.5
0.44
0.18 x 0.13
PEIR-Plan-100x
100x
10.0
0.75
0.7
0.9
0.22
0.09 x 0.07