Active Cantilever Scanning Microscopy

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Active Cantilever Scanning Microscopy

 

The atomic force microscope (AFM) is capable of imaging local material properties such as topology, friction, electrostatic interaction, electrical conductivity, magnetism etc. The image of a selected area is obtained by detecting the force between the probe and the sample. nanoMETRONOM® AFM systems utilize novel thermomechanical (self-transduced) and piezoresistive (self-sensed using 2DEG read-out) cantilevers for rapid non-contact imaging.

  • Modular system components include damping, environmental chamber, positioning stage

  • SmartActiveProbe (cantilever) with active thermomechanical actuation for atomic resolution

  • Fastest SPM system in vacuum, air, and liquid

  • Cantilever head for fast plug-and-play cantilever exchange

  • Scanner and probe can be can be easily adapted to customer’s requirements

    FUNCTIONS

    Operation Mode

    AC mode / DC mode

    Topography Imaging

    YES

    Amplitude / Phase Imaging

    YES

    Force Curve Chart

    YES

    Sample / Probe Approach

    Automatic

    Probe tuning

    Automatic

    Detection Principle

    Piezoresistive

    Resolution Amplitude / Phase

    16-bit

    Feedback control platform

    Realtime FPGA

    Front End Bandwidth

    8 MHz

    Simultaneous Images

    Phase, frequency, amplitude, topography

    Measurement Modes

    MFM, EFM, PFM, C-AFM, SThM

 

 
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